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Electronic Systems Design Seminar
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Coverage metrics are widely used in simulation-based verification
techniques (testing) as heuristic measures of exhaustiveness of a given test. In the last few years there has been growing awareness of
the importance of measuring the exhaustiveness of formal-verification processes as well. Indeed, specifications are written manually, and
their completeness depends entirely on the competence of the person who writes them.
The talk presents a study of coverage metrics in formal verification. I will describe several approaches to the definition of coverage
metrics and efficient algorithms that compute these metrics.
This is a joint work with Orna Kupferman, Robert Kurshan, and Moshe Vardi.
Hana Chockler is a Ph.D. candidate in the School of Computer Science and Engineering at the Hebrew University in Israel. Her research interests are in formal verification of reactive systems and in randomized algorithms. Hana received her B.Sc. from the Hebrew University in 1992, and her M.Sc. from the Tel-Aviv University in 1996.