M. Ray Mercer

M. Ray Mercer is a professor of electrical engineering at Texas A & M University, where he holds the Computer Engineering Chair. His research interests are centered in the computer-aided design of digital systems and include: design verification, simulation, design for testability, the modeling of logic network functionality, automatic test pattern generation, and multi-level logic minimization.

Previously, Dr. Mercer worked at: The University of Texas, Austin, TX; AT&T Bell Laboratories, Murray Hill, NJ; Hewlett-Packard Laboratories, Palo Alto, CA; and General Telephone and Electronics, Mountain View, CA. He holds a B.S.E.E. from Texas Tech University, an M.S.E.E. from Stanford University, and a Ph.D. in Electrical Engineering from The University of Texas at Austin. He was the Program Chairman for the 1989 International Test Conference and holds two patents in design for testability. Mercer became a National Science Foundation Presidential Young Investigator in 1986; he has won Best Paper Awards at both the International Test Conference (in 1982) and the Design Automation Conference (in 1991); he is a Fellow of the Institute of Electrical and Electronics Engineers.

Email address: mercer@ee.tamu.edu

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